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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 27 of 31 found articles
| Title: |
The Most Reliable and Precise Model to Determine Schottky Barrier Height and Photoelectron Yield Spectroscopy |
| Author: |
Changshi, Liu |
| Appeared in: |
Optical and quantum electronics |
| Paging: | Volume 51 () nr. 11 pages 1-8 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 27 of 31 found articles
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